Robert W. Carpick's Extended Homepage

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Robert Carpick
Associate Professor

University of Wisconsin
543 Engineering Research Building
1500 University Ave.
Madison, WI 53706

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Publications Below is a list of Prof. Carpick's publications. Most are available as .pdf downloads. If the article is not available, click here to request reprints by email.
	Invited Review Articles

			Atomic-scale friction and its connection to fracture mechanics
				R.W. Carpick, E.E. Flater, K. Sridharan, D.F. Ogletree, and M. Salmeron
			JoM 56 (10) 48-52 (2004).

			Measurements of in-plane materials properties with SPM
				R.W. Carpick, M.A. Eriksson
			MRS Bulletin, 29 (7), 472 (2004).

			Polydiacetylene films: A review of recent investigations into chromogenic transitions and nanomechanical properties
				R.W. Carpick, D.Y. Sasaki, M.S. Marcus, M. A. Eriksson, and A.R. Burns
			J. Phys.: Cond. Matt., 16,(23), R679 -R697 (2004).

			Scratching the surface: Fundamental investigations of tribology with atomic force microscopy
				R.W. Carpick and M. Salmeron
			Chemical Reviews 97 (4), 1163 (1997).

	Peer-Reviewed Research Publications – Accepted or Published

			Lateral force calibration in atomic force microscopy: A new lateral force calibration method and general guidelines for optimization
				R.J. Cannara, M. Eglin, R.W. Carpick
			Rev. Sci. Instrum., recommended for publication (2006).

			Mechanical analysis, characterization, and design considerations of vibrations in “beetle”-type scanning probe microscopes
				M.J. Brukman, and R.W. Carpick
			Rev. Sci. Instrum., in press (2006).

			Growth of mechanically fixed and isolated vertically-aligned carbon nanotubes and nanofibers for nanomechanical testing by DC-plasma-enhanced hot filament chemical vapor deposition
				H.Y. Yap, B. Ramaker, A.V. Sumant, R.W. Carpick
			Diam. Rel. Mater., in press (2006).

			Nanotribological properties of alkanephosphonic acid self-assembled monolayers on aluminum oxide: Effects of fluorination and substrate crystallinity
				M.J. Brukman, G.O. Marco, T.D. Dunbar, L.D. Boardman, and R.W. Carpick
			Langmuir, in press (2006).

			Microparticle manipulation using inertial forces
				M. Eglin, M.A. Eriksson, and R.W. Carpick
			Appl. Phys. Lett., 88 (2006) 091913/1-3.
			Click here for a movie showing one dimensional partical manipulation
			Click here for a movie showing two dimensional partical manipulation

			Multiscale roughness and modeling of MEMS interfaces
				C. K. Bora, E.E. Flater, M.D. Street, J.M. Redmond, M.J. Starr, M.E. Plesha, and R.W. Carpick
			Trib. Lett., 19 (1) 37-48 (2005).

			Cantilever tilt compensation for variable-load atomic-force microscopy
				R.J. Cannara, M.J. Brukman, and R.W. Carpick
			Rev. Sci. Instrum., 76 (5) 53706 1-6 (2005).

			In-situ wear studies of surface micromachined interfaces subject to controlled loading
				E.E. Flater, A.D. Corwin, M.P. de Boer, and R.W. Carpick
			Wear, 260 (6) 580-593 (2006).

			Accounting for the JKR-DMT transition in adhesion and friction measurements with AFM
				D.S. Grierson, E.E. Flater, and R.W. Carpick
			J. Adhes. Sci. Technol., 19 (3-5) 291-311(2005).

			Toward the ultimate tribological interface: Surface chemical optimization and nanoscale single asperity properties of ultrananocrystalline diamond
				A.V. Sumant, D.S. Grierson, J.E. Gerbi, J. Birrell, U.D. Lanke, O. Auciello, J.A. Carlisle, and R.W. Carpick
			Adv. Mat., 17 (8) 1039-1045 (2005).
			Supplementary Information
			News Article in Nature's Nanozone News


			Phase imaging and the lever-sample tilt angle in dynamic atomic force microscopy
				M.J. D’Amato, M.S. Marcus, M. A. Eriksson, and R.W. Carpick
			Appl. Phys. Lett., 85 (20) 4738-40 (2004).

			The role of contaminants in the variation of adhesion, friction, and electrical conduction properties of carbide-coated scanning probe tips and Pt(111) in ultrahigh vacuum
				M. Enachescu, R.W. Carpick, D.F. Ogletree, and M. Salmeron
			J. Appl. Phys., 95 (12) 7694 (2004).

			In-plane contributions to phase contrast in intermittent contact atomic force microscopy
				M. S. Marcus, M .A. Eriksson, D.Y. Sasaki, and R.W. Carpick
			Ultramicroscopy, 97 (1-4) 145-50 (2003).

			Nanotribology of CoCr-UHMWPE TJR prosthesis using atomic force microscopy
				S. P. Ho, R. W. Carpick, T. Boland, and M. LaBerge
			Wear, 253 (11-12) 1145-55 (2002).

			Material anisotropy revealed by phase contrast in intermittent contact atomic force microscopy
				M. S. Marcus, R. W. Carpick, D. Y. Sasaki, and M.A. Eriksson
			Phys Rev. Lett., 88 (22) 226103/1-4 (2002).

			Abrasion of steel by ceramic coatings: Comparison of RF-DLC to sputtered B4C
				S.J. Harris, G.G. Krauss, S.J. Simko, T.J. Potter, R.W. Carpick, B. Welbes, and M. Grischke
			Tribology Lett., 12 (1) 43-50 (2001).

	The influence of coating structure on micromachine stiction
		J.G. Kushmerick, M.G. Hankins, M.P. de Boer, P.J. Clews, R.W. Carpick, and B.C. Bunker
	Tribology Lett., 10 (1-2), 103-8 (2001).

	Shear-induced mechanochromism in polydiacetylene monolayers
		A.R. Burns, R.W. Carpick, D. Y. Sasaki, J. A. Shelnutt, and R. Haddad
	Tribology Lett., 10 (1-2), 89 (2001).

	Directional shear force microscopy
		A.R. Burns and R.W. Carpick
	Appl. Phys. Lett., 78 (3), 317 (2001).

	The impact of solution agglomeration on the deposition of self-assembled monolayers
		B.C. Bunker, R.W. Carpick, R. Assink, M. Thomas, M.G. Hankins, J. Voigt, D. Sipola, M.P. de Boer, J. Martin, and G. Gulley
	Langmuir 16 (20), 7742 (2000).

	High molecular orientation in mono- and tri-layer polydiacetylene films imaged by atomic force microscopy
		D. Y. Sasaki, R.W. Carpick, and A.R. Burns
	J. Colloid Interf. Sci, 229 (2), 490 (2000).

	Spectroscopic ellipsometry and fluorescence study of thermochromism in an ultrathin poly(diacetylene) film: Reversibility and transition kinetics
		R.W. Carpick, T.M. Mayer, D.Y.Sasaki, and A.R. Burns
	Langmuir, 16 (10), 4639 (2000).

	First observation of mechanochromism at the nanometer scale
		R.W. Carpick, D. Y. Sasaki, and A.R. Burns
	Langmuir, 16 (3), 1270 (2000).

	Large friction anisotropy of a polydiacetylene monolayer
		R.W. Carpick, D.Y. Sasaki, and A.R. Burns
	Tribology Lett., 7 (2-3), 79 (1999).

	Observation of proportionality between friction and contact area
		M. Enachescu, R.J.A. van den Oetelaar, R.W. Carpick, D.F. Ogletree, C.F.J. Flipse, and M. Salmeron
	Tribology Lett., 7 (2-3), 73 (1999).

	Molecular level friction as revealed with a novel scanning probe
		A.R. Burns, J.E. Houston, R.W. Carpick, and T.A. Michalske
	Langmuir, 15 (8), 2922 (1999).

	A general equation for fitting contact area and friction vs. load measurements
		R.W. Carpick, D.F. Ogletree, and M. Salmeron
	J. Colloid Interface Sci., 211 (2), 395 (1999).

	Friction and molecular deformation in the tensile regime
		A.R. Burns, J.E. Houston, R.W. Carpick, and T.A. Michalske
	Phys. Rev. Lett., 82 (6), 1181 (1999).

	An atomic force microscope study of an ideally hard contact: The diamond(111)/tungsten carbide interface
		M. Enachescu, R.J.A van den Oetelaar, R.W. Carpick, D.F. Ogletree, C.F.J. Flipse, and M. Salmeron
	Phys. Rev. Lett., 81 (9), 1877 (1998).

	Friction force microscopy investigations of potassium halide surfaces in ultrahigh vacuum: Structure, friction and surface modification
		R.W. Carpick, D.F. Ogletree, and M. Salmeron
	Tribology Lett., 5, 91 (1998).

	The use of capacitance to measure surface forces. 2. Application to the study of contact mechanics
		P. Frantz, A. Artsyukhovich, R.W. Carpick, and M. Salmeron
	Langmuir 13 (22), 5957 (1997).

	Lateral stiffness: A new nanomechanical measurement for the determination of shear strengths with friction force microscopy
		R.W. Carpick, D.F. Ogletree, and M. Salmeron
	Appl. Phys. Lett. 70 (12), 1548 (1997).

	Calibration of frictional forces in atomic force microscopy
		D.F. Ogletree, R.W. Carpick, and M. Salmeron
	Rev. Sci. Instrum. 67 (9), 3298 (1996).
	Click here for additional, updated information

	Variation of the interfacial shear strength and adhesion of a nanometer-sized contact
		R.W. Carpick, N. Agraït, D.F. Ogletree, and M. Salmeron
	Langmuir 12 (13), 3334 (1996).

	Measurement of interfacial shear (friction) with an ultra-high vacuum atomic force microscope
		R.W. Carpick, N. Agraït, D.F. Ogletree, and M. Salmeron
	J. Vac. Sci. Technol. B 14 (2), 1289 (1996).

	Imaging and manipulation of nanometer size liquid droplets by scanning polarization force microscopy
		J. Hu, R.W. Carpick, M. Salmeron, and X.-D. Xiao
	J. Vac. Sci. Technol. B 14 (2), 1341 (1996).

	A variable temperature ultrahigh vacuum atomic force microscope
		Q. Dai, R. Völlmer, R.W. Carpick, D.F. Ogletree, and M. Salmeron
	Rev. Sci. Instrum. 66 (11), 5266 (1995).

	Raman study of oxygen in the oxide superconductor Bi_₂CaSr_₂Cu_₂O_{_8+d}
		Y.H. Shi, M.J.G Lee, M. Moskovits, R. Carpick, A. Hsu, B.W. Statt, and Z. Wang
	Phys. Rev. B (Cond. Matt.) 45 (1), 370 (1992).

	Laser heating of a sintered oxide superconductor
		Y.H. Shi, M.J.G. Lee, M. Moskovits, A. Hsu, and R. Carpick
	J. Appl. Phys. 70 (4), 1915 (1991).

	Invited Book Chapters

			Scanning probe studies of nano-scale adhesion between solids in the presence of liquids and monolayer films
				R.W. Carpick, J.D. Batteas, M.P. de Boer
			In: Handbook of Nanotechnology (2nd Edition)Ed. B. Bhushan (Springer Verlag) in press (2005). (Chapter in 1st Edition published 2004).

			Chromic transitions and nanomechanical properties of (poly)diacetylene molecular films
				R.W. Carpick, A.R. Burns, D.Y. Sasaki, M. A. Eriksson, M.S. Marcus
			In: Chromogenic Phenomena in Polymers: Tunable Optical Properties, Eds. D. Kiserow and S.A. Jenekhe (ACS Books) 2004.

			Acid-base interactions at the molecular level: Adhesion and friction studies with Interfacial Force Microscopy
				A.R. Burns, J.E. Houston, R.W. Carpick and T.A. Michalske
			In: Acid-Base Interactions: Relevance to Adhesion Science and Technology, Volume 2, Ed. K. L. Mittal, (V.S.P. International Science) 2000.

	Invited Magazine Article

			Vacuum applications of the atomic force microscope are enabling nanotechnology
				R. W. Carpick
			Vacuum Solutions, 1 (18), 15 (2000).

	Refereed Conference Papers

			Contact mechanics description of inelastic displacement response of a nanopositioning device
				M.J. Starr, E.D. Reedy, A.D. Corwin, R.W. Carpick, E.E. Flater
			Proc. 2005 Int. Conf. on MEMS, NANO and Smart Systems, 421-2 (2005).

			Nanoscale confinement and ordering of ultrathin anodized alumina nanopore structures on silicon
				P.J. Griffin, R.W. Carpick, and D.S. Stone
			Mat. Res. Soc. Symp. Proc., 854E, U11.5.1-6 (2005).

			Multi-scale roughness of MEMS surfaces
				Can K. Bora, M.E. Plesha, E.E. Flater, M.D. Street, and R.W. Carpick
			Proc. of the 2004 ASME/STLE Joint International Tribology Conference, Long Beach CA, October 24-27, 2004.

			Pre-sliding tangential deflections can govern the friction of MEMS devices
				A.D. Corwin, M.D. Street, R.W. Carpick, W.R. Ashurst, and M.P. de Boer
			Proc. of the 2004 ASME/STLE Joint International Tribology Conference, Long Beach CA, October 24-27, 2004.

			Making, breaking, and sliding of nanometer-scale contacts
				R.W. Carpick, M. Enachescu, D.F. Ogletree and M. Salmeron
			Fracture and Ductile vs. Brittle Behavior-Theory, Modeling and Experiment, eds. G.E. Beltz, R.L.B. Selinger, K.-S. Kim and M.P. Marder, p. 93. Mat. Res. Soc. Symp. Proc. Vol. 539. Materials Research Society, Warrendale, PA, 1999.


	Conference Papers

			Atomic scale friction and its connections to fracture
				R.W. Carpick
			Proc. of the 11th International Conference on Fracture, Turin, Italy, March 20-25, 2005.

			Contact modeling of SAM-coated polysilicon asperities
				E. D. Reedy, M. J. Starr, R. E. Jones, E. E. Flater, and R. W. Carpick
			Proc. of the 28th Annual Meeting of the Adhesion Society Meeting, Mobile AL, Feb. 2005.

			Analysis of contact forces using AFM data of polycrystalline silicon surfaces
				M.J. Starr, H. Sumali, J.M. Redmond, E.E. Flater, and R.W. Carpick
			Proc. of the SEM X International Congress and Exposition on Experimental and Applied Mechanics, Costa Mesa, CA, July 2004.

			The effect of surface chemistry and structure on nano-scale adhesion and friction
				R.W. Carpick , E.E. Flater, and K. Sridharan
			PMSE Preprints, 90, 197, (2004).

			Nanometer-scale studies of anisotropic polymer surfaces
				R.W. Carpick, M.S. Marcus, M.J. D’Amato, D.Y. Sasaki, and M. A. Eriksson
			Polym. Preprints, 88, 499 (2003).

			Friction in MEMS: From single to multiple asperity contact
				R.W. Carpick, E.E. Flater, J.R. VanLangendon, and M.P. de Boer
			Proc. of the SEM VIII International Congress and Exposition on Experimental and Applied Mechanics, p. 282 (2002).

			Oxide nanocomposites for MEMS applications
				R.R. O’Keefe, R.W. Carpick, R.F. Cooper, W.J. Drugan, and D.S. Stone
			Proc. of the SEM VIII International Congress and Exposition on Experimental and Applied Mechanics, p. 160 (2002).

			Nano-scale topographic control of polymer surfaces via buckling instabilities
				S. Zhao, F. Denes, S. Manolache, and R.W. Carpick
			Proc. of the SEM VIII International Congress and Exposition on Experimental and Applied Mechanics, p. 162 (2002).

			Mechanical analysis and measurement of scanning probe microscope performance
				M.J. Brukman and R.W. Carpick
			Proc. of the SEM VIII International Congress and Exposition on Experimental and Applied Mechanics, p. 49 (2002).

			Frictional and adhesive properties of diamond-like carbon/ silicon nitride nanocontacts
				E.E. Flater, J.R. VanLangendon, E.H. Wilson, K. Sridharan, and R.W. Carpick
			Proc. of the SEM VIII International Congress and Exposition on Experimental and Applied Mechanics, p. 42 (2002).

			Thermochromic transitions of (poly)diacetylene molecular layers
				R.W. Carpick, D.Y. Sasaki, T.M. Mayer and A.R. Burns
			Polym. Preprints, (2001).

			Nanocontacts: Fabrication, characterization, and nanotribology studies
				R.W. Carpick, J. R. VanLangedon, E. H. Wilson, and K. Sridharan
			Proc. of the SEM VII International Congress and Exposition on Experimental and Applied Mechanics, 725 (2001).

			Nanometer-scale structural, tribological, and optical properties of ultrathin poly(diacetylene) films
				R.W. Carpick, D.Y. Sasaki, and A.R. Burns
			Polym. Preprints., 41 (2), 1458 (2000).

			Friction and load on well defined surfaces studied by atomic force microscopy
				D.F. Ogletree, J. Hu, X.-D. Xiao, C. Morant, Q. Dai, R. Völlmer, R. Carpick and M. Salmeron
			Forces in Scanning Probe Methods, eds. H.-J. Güntherodt, D. Anselmetti and E. Meyer, 337-344. NATO ASI Series E : Applied Sciences. Kluwer Academic Publishers, The Netherlands, 1995.

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Updated 3/20/06